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07.05.2024

Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source

verfasst von: Vipin Kumar, Jayanta Ghosh

Erschienen in: Journal of Electronic Testing

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Abstract

The present article proposes a novel method to reduce phase noise in a PLL based X-Band source consisting of oscillating and non-oscillating components for the use in Pulse Doppler radar. It also provides phase noise performance stabilization under random vibration. The method consists of improved electrical design and PCB layout, noise filtering technique and passive isolation scheme to suppress vibration-induced noise. Acceleration sensitivity is an important requirement for radars and sensors mounted in unmanned aerial vehicles, aircrafts, missiles and other dynamic platforms. These systems provide superior performance when subjected to severe environmental condition. However, mechanical vibration and acceleration can introduce physical deformation that thereby degrades the frequency source generated signal phase noise. It effects the complete radar system that depends on frequency source performance. The development and testing of a stable X-Band source at 10.64 GHz using indirect method has been carried out which proved that the phase noise is stable both in steady state and under random vibration of 7g magnitude. The study of critical design aspects of test fixture, test object mounting arrangement, investigation on vibration response and performance stabilization along with description of test setup and measurement procedure has been reported. An improvement of around 35-40 dB in phase noise is achieved at close-in offset frequencies. Few challenges and suggestions for the accurate measurement of random vibration testing for frequency sources have also been mentioned.

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Metadaten
Titel
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source
verfasst von
Vipin Kumar
Jayanta Ghosh
Publikationsdatum
07.05.2024
Verlag
Springer US
Erschienen in
Journal of Electronic Testing
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-024-06118-6